James Brown

Journal article

Tok KH, Zhang J, Brown J, Ji Z, Zhang W, Marsland J. 2023. Characterizing and Modelling RTN under real circuit bias conditions IEEE Transactions on Electron Devices, 70 :2424-2430 DOI Publisher Url Public Url

Tok KH, Zhang JF, Brown J, Ye Z, Ji Z, Zhang WD, Marsland JS. 2022. AC RTN: Testing, Modeling, and Prediction IEEE Transactions on Electron Devices, :1-7 DOI Publisher Url Public Url

Tok KH, Mehedi M, Zhang JF, Brown J, Ye Z, Ji Z, Zhang W, Marsland JS, Asenov A, Georgiev V. 2022. An Integral Methodology for Predicting Long Term RTN IEEE Transactions on Electron Devices, DOI Publisher Url Public Url

Brown J, Zhang JF, Zhou B, Mehedi M, Freitas P, Marsland J, Ji Z. 2020. Random‑telegraph‑noise‑enabled true random number generator for hardware security Scientific Reports, 10 DOI Author Url Publisher Url Public Url

Chai Z, Wei S, Zhang WD, Brown J, Degraeve R, Salim F, Clima S, Hatem F, Zhang JF, Freitas P, Marsland J, Fantini A, Garbin D, Goux L, Kar G. 2019. GeSe-based Ovonic Threshold Switching Volatile True Random Number Generator IEEE Electron Device Letters, DOI Author Url Publisher Url Public Url

Thesis/Dissertation

Brown J. 2021. Designing, Implementing, and Testing Hardware for Cybersecurity Zhang J, Ji Z, Zhou B. Public Url

Conference publication

Ji Z, Brown J, Zhang J. 2020. TRUE RANDOM NUMBER GENERATOR (TRNG) FOR SECURE COMMUNICATIONS IN THE ERA OF IOT Claeys C, Liang S, Lin Q, Huang R, Wu H, Song P, Lai K, Zhang Y, Zang B, Qu X, Lung HL, Yu W. 2020 CHINA SEMICONDUCTOR TECHNOLOGY INTERNATIONAL CONFERENCE 2020 (CSTIC 2020), China Semiconductor Technology International Conference (CSTIC) DOI Author Url Publisher Url

Brown J, Gao R, Ji Z, Chen J, Wu J, Zhang JF, Zhou B, Shi Q, Crawford J, Zhang WD. A low-power and high-speed True Random Number Generator using generated RTN 2018 Symposia on VLSI Technology and Circuits DOI Author Url Publisher Url Public Url