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School of Engineering

Dr John Marsland

Dr John Marsland

Telephone: 0151 231 2361

Biography

Head of Department of Electronics and Electrical Engineering at Liverpool John Moores University.

Particular interest in aiding the transition of students from college to University including students with BTEC qualifications.

Research interests:
1) Neural network implementation in hardware, including memristors, trained using limited precision and integer weights.
2) Low level light detection using avalanche photodiodes including Geiger mode or SPADs: Single Photon Avalanche Diodes.

Teaching awards:
1) Sir Alastair Pilkington award for Sustained Excellence in Teaching, University of Liverpool, 2010
2) Greatest Contribution to the Student Experience, University of Liverpool, 2016

Current teaching module delivery: 3105FNDET Foundation Physics: Particles, Fields and Electricity (approx 200 students, level 3).

Degrees

1988, University of Sheffield, United Kingdom, PhD 'Experimental and theoretical ionization coefficients in semiconductors'
1983, University of Southampton, United Kingdom, BSc(Hons) Electronics

Academic appointments

Head of Department, Electronics and Electrical Engineering, Liverpool John Moores University, 2017 - present
Industrial Secondment (sponsored by Royal Academy of Engineering), ARM Research, Cambridge, ARM (United Kingdom), 2002 - 2002
Lecturer / Senior Lecturer, Electrical Engineering and Electronics, University of Liverpool, 1989 - 2017
Research Associate, Electronic and Electrical Engineering, University of Sheffield, 1987 - 1989
Lecturer, Electronic and Electrical Engineering, University of Sheffield, 1986 - 1987

Publications

Highlighted publications

Naeem M, McDaid LJ, Harkin J, Wade JJ, Marsland J. 2015. On the Role of Astroglial Syncytia in Self-Repairing Spiking Neural Networks IEEE Transactions on Neural Networks and Learning Systems, 26 :2370-2380 DOI Author Url Publisher Url

MARSLAND JS, WOODS RC, BROWNHILL CA. 1992. LUCKY DRIFT ESTIMATION OF EXCESS NOISE FACTOR FOR CONVENTIONAL AVALANCHE PHOTODIODES INCLUDING THE DEAD SPACE EFFECT IEEE TRANSACTIONS ON ELECTRON DEVICES, 39 :1129-1135 DOI Author Url

MARSLAND JS. 1990. ON THE EFFECT OF IONIZATION DEAD SPACES ON AVALANCHE MULTIPLICATION AND NOISE FOR UNIFORM ELECTRIC-FIELDS JOURNAL OF APPLIED PHYSICS, 67 :1929-1933 DOI Author Url

MARSLAND JS. 1987. A LUCKY DRIFT MODEL, INCLUDING A SOFT THRESHOLD ENERGY, FITTED TO EXPERIMENTAL MEASUREMENTS OF IONIZATION COEFFICIENTS SOLID-STATE ELECTRONICS, 30 :125-132 DOI Author Url

Journal article

Chai Z, Wei S, Zhang W, Brown J, Degraeve R, Salim F, Clima S, Hatem F, Zhang J, Freitas P, Marsland J, Fantini A, Garbin D, Goux L, Kar G. 2019. GeSe-based Ovonic Threshold Switching Volatile True Random Number Generator IEEE Electron Device Letters, 41 :228-231 DOI Author Url Publisher Url Public Url

Chai Z, Zhang W, Degraeve R, Clima S, Hatem F, Zhang JF, Freitas P, Marsland J, Fantini A, Garbin D, Goux L, Kar GS. 2019. Dependence of switching probability on operation conditions in GexSe1-x ovonic threshold switching selectors IEEE Electron Device Letters, :1-1 DOI Author Url Publisher Url Public Url

Chai Z, Zhang W, Degraeve R, Zhang JF, Marsland J, Fantini A, Garbin D, Clima S, Goux L, Kar GS. 2019. RTN in GexSe1-x OTS Selector Devices Microelectronic Engineering, 215 DOI Author Url Publisher Url Public Url

Ma J, Chai Z, Zhang W, Zhang J, Marsland J, Govoreanu B, Degraeve R, Goux L, Kar G. 2019. TDDB mechanism in a-Si/TiO2 non-filamentary RRAM device IEEE Transactions on Electron Devices, 66 :777-784 DOI Author Url Publisher Url Public Url

Gao R, Ji Z, Zhang JF, Marsland J, Zhang W. 2018. As-grown-Generation (A-G) Model for Positive Bias Temperature Instability (PBTI) IEEE Transactions on Electron Devices, 65 :3662-3668 DOI Author Url Publisher Url Public Url

Chai Z, Freitas P, Zhang W, Hatem F, Zhang JF, Marsland J, Govoreanu B, Goux L, Kar GS. 2018. Impact of RTN on Pattern Recognition Accuracy of RRAM-based Synaptic Neural Network IEEE Electron Device Letters, DOI Author Url Publisher Url Public Url

Chai Z, Zhang W, Freitas P, Hatem F, Zhang JF, Marsland J, Govoreanu B, Goux L, Kar GS, Hall S, Chalker P, Robertson J. 2018. The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique IEEE Electron Device Letters, 39 :955-958 DOI Author Url Publisher Url Public Url

Naeem M, McDaid LJ, Harkin J, Wade JJ, Marsland J. 2015. On the Role of Astroglial Syncytia in Self-Repairing Spiking Neural Networks IEEE Transactions on Neural Networks and Learning Systems, 26 :2370-2380 DOI Author Url Publisher Url

Ghani A, McDaid L, Belatreche A, Hall S, Huang S, Marsland J, Dowrick T, Smith A. 2012. Evaluating the generalisation capability of a CMOS based synapse Neurocomputing, 83 :188-197 DOI

Dehwah AH, Ajia IA, Marsland JS. 2011. EMPIRICAL FORMULAE FOR EXCESS NOISE FACTOR WITH DEAD SPACE FOR SINGLE CARRIER MULTIPLICATION FLUCTUATION AND NOISE LETTERS, 10 :315-321 DOI Author Url

Marsland JS. 2011. Comparison of different models of non-local impact ionization for low noise avalanche photodiodes Kugler S, Kokenyesi S, Stutzmann M, Bahrs S, Stass I, Cavalleri M. PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 9, 8 :2577-2581 DOI Author Url

Marsland JS. 2009. Impact ionization in semiconductors: recent progress on non-local effects PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 206 :874-879 DOI Author Url

Marsland JS. 2003. Lucky drift model for non-local impact ionisation incorporating a soft threshold energy IEE PROCEEDINGS-OPTOELECTRONICS, 150 :119-124 DOI Author Url

Marsland JS. 2002. Nonlocal impact ionisation coefficients derived from Monte Carlo calculations ELECTRONICS LETTERS, 38 :55-57 DOI Author Url

JOHNSON DE, MARSLAND JS, ECCLESTON W. 1995. NEURAL-NETWORK IMPLEMENTATION USING A SINGLE MOST PER SYNAPSE IEEE TRANSACTIONS ON NEURAL NETWORKS, 6 :1008-1011 DOI Author Url

YUAN XJ, MARSLAND JS, ECCLESTON W, BOUVET D, MI J, DUTOIT M. 1995. CHARGE TRAPPING AND INTERFACE STATE GENERATION IN RAPID THERMAL PROCESSED OXIDE AND NITRIDED-OXIDE MOS CAPACITORS BY ELECTRON PHOTOINJECTION FROM AL GATE AND SI SUBSTRATE JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 142 :1021-1024 DOI Author Url

YUAN XJ, MARSLAND JS, ECCLESTON W, BOUVET D, MI J, DUTOIT M. 1994. CHARGE TRAPPING AND POLARITY DEPENDENCE OF INTERFACE STATE GENERATION IN NITRIDED-OXIDE GATE DIELECTRIC BY ELECTRON PHOTOINJECTION ELECTRONICS LETTERS, 30 :1180-1181 DOI Author Url

YUAN XJ, MARSLAND JS, ECCLESTON W. 1993. SUBSTRATE HOT-ELECTRON INJECTION MODELING BASED ON LUCKY DRIFT THEORY MICROELECTRONIC ENGINEERING, 22 :261-264 DOI Author Url

MARSLAND JS, WOODS RC, BROWNHILL CA. 1992. LUCKY DRIFT ESTIMATION OF EXCESS NOISE FACTOR FOR CONVENTIONAL AVALANCHE PHOTODIODES INCLUDING THE DEAD SPACE EFFECT IEEE TRANSACTIONS ON ELECTRON DEVICES, 39 :1129-1135 DOI Author Url

MARSLAND JS. 1991. CORRECTION ELECTRONICS LETTERS, 27 :2399-2399 DOI Author Url

MARSLAND JS. 1991. TEMPERATURE-DEPENDENCE OF IONIZATION COEFFICIENTS IN SILICON DERIVED FROM PHYSICAL MODEL ELECTRONICS LETTERS, 27 :1997-1998 DOI Author Url

MARSLAND JS. 1990. ON THE EFFECT OF IONIZATION DEAD SPACES ON AVALANCHE MULTIPLICATION AND NOISE FOR UNIFORM ELECTRIC-FIELDS JOURNAL OF APPLIED PHYSICS, 67 :1929-1933 DOI Author Url

MARSLAND JS. 1990. POWER-SERIES APPROXIMATION USED IN SOFT THRESHOLD LUCKY DRIFT MODEL OF IMPACT IONIZATION SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 5 :177-182 DOI Author Url

DAVID JPR, MARSLAND JS, ROBERTS JS. 1989. THE ELECTRON-IMPACT IONIZATION RATE AND BREAKDOWN VOLTAGE IN GAAS/GA0.7AL0.3AS MQW STRUCTURES IEEE ELECTRON DEVICE LETTERS, 10 :294-296 DOI Author Url

MARSLAND JS. 1988. CORRECTION IEE PROCEEDINGS-J OPTOELECTRONICS, 135 :165-165 DOI Author Url

MARSLAND JS, WOODS RC. 1987. LUCKY DRIFT MODELS OF MULTILAYERED STRUCTURES AND APPROXIMATE FORMS OF LUCKY DRIFT EXPRESSIONS IEE PROCEEDINGS-J OPTOELECTRONICS, 134 :313-322 DOI Author Url

MARSLAND JS. 1987. A LUCKY DRIFT MODEL, INCLUDING A SOFT THRESHOLD ENERGY, FITTED TO EXPERIMENTAL MEASUREMENTS OF IONIZATION COEFFICIENTS SOLID-STATE ELECTRONICS, 30 :125-132 DOI Author Url

Conference publication

Hatem F, Chai Z, Zhang W, Fantini A, Degraeve R, Clima S, Garbin D, Robertson J, Guo Y, Zhang JF, Marsland J, Freitas P, Goux L, Kar G. 2019. Endurance improvement of more than five orders in GexSe1-x OTS selectors by using a novel refreshing program scheme IEEE International Electron Device Meeting (IEDM), San Francisco, USA. DOI Public Url

Chai Z, Zhang W, Degraeve R, Clima S, Hatem F, Zhang JF, Freitas P, Marsland J, Fantini A, Garbin D, Goux L, Kar G. 2019. Evidence of filamentary switching and relaxation mechanisms in GexSe1-x OTS selectors 2019 Symposia on VLSI Technology and Circuits DOI Public Url

Stromatias E, Marsland JS. 2015. Supervised learning in Spiking Neural Networks with Limited Precision: SNN/LP 2015 INTERNATIONAL JOINT CONFERENCE ON NEURAL NETWORKS (IJCNN), International Joint Conference on Neural Networks (IJCNN) DOI Author Url

Ghani A, McDaid LJ, Belatreche A, Kelly P, Hall S, Dowrick T, Huang S, Marsland J, Smith A. 2011. Evaluating the training dynamics of a CMOS based synapse Proceedings of the International Joint Conference on Neural Networks, :1162-1168 DOI

Hasan SA, Hall S, Marsland JS. 2011. A wide linear range OTA-C filter for bionic ears 2011 3rd Computer Science and Electronic Engineering Conference, CEEC'11, :19-22 DOI

Hasan SA, Hall S, Marsland JS. 2011. A proposed sub-threshold OTA-C filter for Hearing Aids 2011 IEEE 9th International New Circuits and Systems Conference, NEWCAS 2011, :414-417 DOI

Marsland JS. 2009. Resonance effects on gain and noise in avalanche photodiodes JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2nd International Conference on Optical and Optoelectronic Properties of Materials and Applications 20 :514-518 DOI Author Url

Marsland JS, Atanu AG. 2009. Evidence of non-local impact ionization in CNT and HgCdTe Palermo C, Bastard G. 16TH INTERNATIONAL CONFERENCE ON ELECTRON DYNAMICS IN SEMICONDUCTORS, OPTOELECTRONICS AND NANOSTRUCTURES (EDISON 16), 16th International Conference on Electron Dynamics in Semiconductors, Optoelectronics and Nanostructures (EDISON 16) 193 DOI Author Url

McDaid L, Harkin J, Hall S, Dowrick T, Chen Y, Marsland J. 2008. EMBRACE: Emulating Biologically-Inspired architectures on Hardware Dimitrov DP, Mladenov V, Jordanova S, Mastorakis N. PROCEEDINGS OF THE 9TH WSEAS INTERNATIONAL CONFERENCE ON NEURAL NETWORKS (NN' 08), 9th WSEAS International Conference on Neural Networks (NN 08) :167-+ Author Url

Marsland JS, Clemow S, Williams G, Taylor S, Zamani R. 1999. Multisite interface between silicon integrated circuit and neural tissue IEE Colloquium (Digest), :90-93

Yildirim T, Marsland JS. 1997. Improved back propagation training algorithm using conic section functions 1997 IEEE INTERNATIONAL CONFERENCE ON NEURAL NETWORKS, VOLS 1-4, 1997 IEEE International Conference on Neural Networks (ICNN 97) :1078-1081 DOI Author Url

Yildirim T, Marsland JS. 1997. A unified framework for connectionist models Bullinaria JA, Glasspool DW, Houghton G. 4TH NEURAL COMPUTATION AND PSYCHOLOGY WORKSHOP, LONDON, 9-11 APRIL 1997, 4th Neural Computation and Psychology Workshop (NCPW4) :26-39 Author Url

Yildirim T, Marsland JS. 1996. A conic section function network synapse and neuron implementation in VLSI hardware ICNN - 1996 IEEE INTERNATIONAL CONFERENCE ON NEURAL NETWORKS, VOLS. 1-4, 1996 IEEE International Conference on Neural Networks (ICNN 96) :974-979 Author Url

Yuan XJ, Marsland JS. 1995. Study of oxide field and electron energy dependence of interface-state generation in MOS structure by electron injection from Al gate and Si substrate Baldwin GL, Li ZJ, Tsai CC, Zhang JS. PROCEEDINGS OF THE FOURTH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY, 4th International Conference on Solid-State and Integrated-Circuit Technology :A416-A418 Author Url

Johnson DE, Marsland JS, Eccleston W. 1994. Integrated neural network incorporating a novel synapse design IEE Colloquium (Digest),

Griffiths PJ, Marsland JS, Eccleston W. 1994. Study of noise in PWM neural networks IEE Colloquium (Digest),

MARSLAND JS, WOODS RC, BROWNHILL CA, GOULD S. 1990. ESTIMATION OF NOISE-FIGURE FOR CONVENTIONAL AND MULTILAYERED AVALANCHE PHOTODIODES USING THE LUCKY DRIFT MODEL ECCLESTON W, ROSSER PJ. ESSDERC 90, 20TH EUROPEAN SOLID STATE DEVICE RESEARCH CONF ( ESSDERC 90 ) :567-570 Author Url

McDaid LJ, Hall S, Marsland JS, Eccleston W, Alderman JC, Cook KR, Bunyan RJ, Uren MJ. 1990. A simple model to predict the holding voltage for SOI mosfets operating in the latch state 1990 IEEE SOS/SOI Technology Conference, Proceedings, :19-20 DOI

Marsland JS, Woods RC. 1986. APPROXIMATE FORM OF THE 'LUCKY-DRIFT' EXPRESSION FOR IONISATION COEFFICIENTS USED IN EVALUATION OF SUPERLATTICE STRUCTURES. Conference on Solid State Devices and Materials, :667-670 DOI

David JPR, Marsland JS, Hall HY, Hill G, Mason NJ, Pate MA, Roberts JS, Robson PN, Sitch JE, Woods RC. 1985. MEASURED IONIZATION COEFFICIENTS IN Ga//1// minus //xAl//xAs. Institute of Physics Conference Series, :247-252

Zhang J, Manut A, Gao R, Mehedi M, Ji Z, Zhang W, Marsland J. An assessment of RTN-induced threshold voltage jitter Proceedings of 2019 13th IEEE International Conference on ASIC (ASICON), ChongQing, 2019., DOI Author Url Public Url

Engagement & Impact

Membership of professional bodies:

MIEEE, Institute of Electrical and Electronics Engineers.

MIET, The Institution of Engineering and Technology.