Electrical and Electronic Engineering Research Centre

About the Centre

Learn more about research within the Centre

The Electrical and Electronic Engineering Research Centre conducts research into both microelectronics and electric machines and drives. 

More specifically, the Electrical and Electronic Engineering Research Centre’s two groups – the Microelectronics Research Group and the Electric Machines and Drives Research Group – carry out research within the following key specialisms:

  • New materials and devices for future microelectronic industry
  • New characterisation techniques for VLSI devices
  • Development of advanced techniques for variables-speed electric drives
  • Qualification, modelling and aging prediction
  • Development of novel control techniques for power electronic converters
  • Modelling, simulation and experimental characterisation of power electronic converters and variable speed drives

In the latest research assessment (Research Excellence Framework 2014), seven of the Centre’s academics submitted to the Unit of Assessment 13. 100% of these research outputs were assessed as internationally excellent (3*), whilst 71% of the submission was ranked as internationally excellent (3*).

Together with industry, researchers from the Electrical and Electronic Engineering Research Centre are currently developing products that will improve our daily lives.

Research impact

The Electrical and Electronic Engineering Research Centre’s work affects us all. In 2011, for example, the Centre developed a new technique for measuring electron mobility.

This technique is important because, since their invention, the speed of computers has continually increased thanks to the development of smaller and smaller transistors. However, transistor speed is determined by electron mobility and as transistors have been getting smaller, measuring electron mobility has become increasingly challenging. Traditionally, the process of measuring electron mobility was also expensive, unreliable and inefficient.

Researchers from the Centre worked with the Logic Devices Consortium at the Inter-University Microelectronics Research Centre in Belgium and together they produced a technique that significantly reduced the costs of testing (saving in excess of £200,000). Furthermore, the researchers improved the reliability of results and halved the number of tests required.

The main beneficiaries of this new technique are test engineers, such as those at the Logic Devices Consortium, and equipment suppliers. One such equipment supplier, Keithley Instruments, has used the technique in its sales promotion material, citing it as one of the strengths of one of its award-winning instruments.